| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | Castilho, Caio Mário Castro de | - |
| dc.creator | Castilho, Caio Mário Castro de | - |
| dc.date.accessioned | 2013-10-15T15:20:04Z | - |
| dc.date.available | 2013-10-15T15:20:04Z | - |
| dc.date.issued | 1999 | - |
| dc.identifier.issn | 0022-3727 | - |
| dc.identifier.uri | http://www.repositorio.ufba.br/ri/handle/ri/13234 | - |
| dc.description | Texto completo. Acesso restrito. p. 2261–2265 | pt_BR |
| dc.description.abstract | Trajectories of positive ions produced in a region close to a structured surface,
modelled by spherical or spheroidal protrusions and kept at a positive electric potential with
respect to a distant screen or detector are calculated. The results are discussed in comparison
with similar practical situations produced by field ionization and field evaporation or
desorption, such as those occurring in gas field ion sources, field ion microscopy and field
desorption spectroscopy. | pt_BR |
| dc.language.iso | en | pt_BR |
| dc.publisher | Journal of Physics D: Applied Physics | pt_BR |
| dc.source | 10.1088/0022-3727/32/17/317 | pt_BR |
| dc.title | Ion trajectories in atom probe field ion microscopy and gas field ion sources | pt_BR |
| dc.title.alternative | Journal of Physics D: Applied Physics | pt_BR |
| dc.type | Artigo de Periódico | pt_BR |
| dc.description.localpub | Salvador | pt_BR |
| dc.identifier.number | v. 32, n. 17 | pt_BR |
| Aparece nas coleções: | Artigo Publicado em Periódico (FIS)
|
